| 1 |
Process Development, Control and qualification for 0.18 Micron Technology |
2000-1-1 |
2004-1-1 |
ملی |
AMD |
|
| 2 |
Characterization of E-poly to determine the Poly CD Variation and LER |
1998-1-1 |
2002-1-1 |
ملی |
AMD |
|
| 3 |
Characterization of PN Junction (Diodes) and Layer resistance (Resistors) |
2002-1-1 |
2005-1-1 |
ملی |
Lattice |
|
| 4 |
Comparison of changes in device Characterization from Wafer to Wafer and Lot to Lot based on DOE Analysis |
2002-1-1 |
2005-1-1 |
ملی |
Lattice |
|
| 5 |
Process Flow EDR Corrections |
2002-1-1 |
2005-1-1 |
ملی |
Lattice |
|
| 6 |
Test and evaluation of Customer return PLD Devices |
2002-1-1 |
2005-1-1 |
ملی |
lattice |
|
| 7 |
Debugging by signal quality measurements using IMS/IDS Tester |
1998-1-1 |
2002-1-1 |
ملی |
AMD |
|
| 8 |
Design and Evaluation of ESD and Latch-up test structures in EEPROM test Chips |
1995-1-1 |
2000-1-1 |
ملی |
Xicor Inc |
|
| 9 |
Reliability Qalification of EEPROM devices |
1995-1-1 |
2000-1-1 |
ملی |
Xicor Inc |
|
| 10 |
DRC for different technology |
1995-1-1 |
2000-1-1 |
ملی |
Xicor Inc |
|
| 11 |
Methods of Package qualifications |
1995-1-1 |
2000-1-1 |
ملی |
Xicor Inc |
|
